Sample interview questions: Can you discuss any experience you have with characterizing and manipulating materials at the atomic level?
Sample answer:
Experience with Characterizing and Manipulating Materials at the Atomic Level:
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Transmission Electron Microscopy (TEM): Conducted studies involving high-resolution imaging and electron diffraction techniques to investigate the atomic structure, defects, and interfaces of various materials, including semiconductors, metals, and oxides. This involved sample preparation, data acquisition, and advanced image analysis.
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Scanning Tunneling Microscopy (STM): Utilized STM for surface characterization and manipulation of materials at the atomic scale. Performed experiments to study surface topography, atomic arrangements, electronic properties, and atomic-scale processes in real-time.
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Scanning Probe Microscopy (SPM): Experienced in operating different types of SPM techniques, such as Atomic Force Microscopy (AFM) and Magnetic Force Microscopy (MFM), to characterize the topography, mechanical, and magnetic properties of materials at the nanoscale.
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Focused Ion Beam (FIB) Milling: Skilled in using FIB to perform site-specific sample preparation and patterning of materials with nanometer precision. Applied this technique to create samples for subsequent atomic-level studies. Read full answer
Source: https://hireabo.com/job/5_0_3/Experimental%20Physicist