Discuss any experience you have with using scanning probe microscopy techniques in condensed matter physics research.

Sample interview questions: Discuss any experience you have with using scanning probe microscopy techniques in condensed matter physics research.

Sample answer:

  • Atomic force microscopy (AFM):
    • Experience in using AFM to study the surface morphology and mechanical properties of materials at the nanoscale.
    • Expertise in preparing and characterizing samples for AFM measurements, including sample cleaning, surface functionalization, and sample mounting.
    • Experience in analyzing AFM data using various software packages.
  • Scanning tunneling microscopy (STM):
    • Experience in using STM to study the electronic structure and surface properties of materials at the atomic scale.
    • Expertise in preparing and characterizing samples for STM measurements, including sample cleavage, surface cleaning, and sample mounting.
    • Experience in analyzing STM data using various software packages.
  • Scanning near-field optical microscopy (SNOM):

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