Sample interview questions: Discuss any experience you have with using scanning probe microscopy techniques in condensed matter physics research.
Sample answer:
- Atomic force microscopy (AFM):
- Experience in using AFM to study the surface morphology and mechanical properties of materials at the nanoscale.
- Expertise in preparing and characterizing samples for AFM measurements, including sample cleaning, surface functionalization, and sample mounting.
- Experience in analyzing AFM data using various software packages.
- Scanning tunneling microscopy (STM):
- Experience in using STM to study the electronic structure and surface properties of materials at the atomic scale.
- Expertise in preparing and characterizing samples for STM measurements, including sample cleavage, surface cleaning, and sample mounting.
- Experience in analyzing STM data using various software packages.
- Scanning near-field optical microscopy (SNOM):
- Experience in using SNOM to study the optical properties of materials at the nanoscale.
- Expertise in preparing and characterizing samples for SNOM measurements, including sample preparation, surface functionalization, and sample mounting.
- Experience in analyzing SNOM data using … Read full answer
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