Sample interview questions: Have you ever worked with plasma-based spectroscopic ellipsometry techniques? If so, can you provide examples?
Sample answer:
Yes, I have extensive experience working with plasma-based spectroscopic ellipsometry techniques. Spectroscopic ellipsometry is a powerful tool used to study the optical properties of materials, and when combined with plasma, it offers unique opportunities for analyzing plasmas and their interactions with various surfaces.
One example of my work involving plasma-based spectroscopic ellipsometry is a study conducted on the plasma-surface interactions in a plasma etching process. In this research, we used spectroscopic ellipsometry to investigate the changes in the optical properties of a material’s surface during plasma etching. By analyzing the ellipsometric data obtained at different plasma conditions, we were able to determine the etch rate, selectivity, and surface roughness of the material under study. This information was essential for optimizing the plasma etching process and understanding the underlying physical mechanisms involved.
Another example of my involvement with plasma-based spectroscopic ellipsometry is in the field of plasma diagnostics. Spectroscopic ellipsometry can be employed to measure the electron density and temperature in a plasma. By analyzing the plasma’s optical response in the form of ellipsometric parameters, such as the amplitude ratio and phase difference, we can extract valuable information about the plasma’s characteristics. This data can then be used to understand plasma instabilities, electron energy distribution functions, and other important plasma properties.
In addition to these examples, I have also uti… Read full answer