Can you explain the principles behind different microscopic imaging techniques used in materials science?

Sample interview questions: Can you explain the principles behind different microscopic imaging techniques used in materials science?

Sample answer:

1. Scanning Electron Microscopy (SEM):

2. Utilizes a focused beam of electrons to scan the surface of a material.

3. Creates high-resolution images by detecting secondary electrons emitted from the sample.

4. Provides detailed information about surface topography, morphology, and composition.

5. Transmission Electron Microscopy (TEM):

6. Utilizes a beam of high-energy electrons that passes through a thin sample.

7. Creates images by detecting electrons that are transmitted through the sample.

8. Provides high-resolution images of internal structures, atomic arrangements, and defects.

9. Scanning Probe Microscopy (SPM):

10. Includes techniques like Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM).

11. Utilizes a sharp probe to scan the surface of a material.
12. Creates images by detecting forces or tunneling currents between the probe and the sample.

13. Provides high-resolution images of surface topography and local properties.

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