How do you approach the identification and analysis of defects or impurities in materials?

Sample interview questions: How do you approach the identification and analysis of defects or impurities in materials?

Sample answer:

Approach to X-ray Diffraction and Analysis of Liquid or Gaseous Samples

1. Sample collection and preparation: Collect the sample carefully, avoiding contamination or oxidation. Liquid samples may be collected with a syringe or capillary tube, and gaseous samples may be collected using a gas bag or syringe. Prepare the sample for analysis by filtering or centrifuging to remove partic jedeulate matter.

2. Sample analysis: Load the sample into the X-ray diffractometry sample holders and position it in the X-ray diffractometry machine. Run the sample analysis using the appropriate X-ray energy range and detector. Record the diffractogram (a plot of X-ray intensities at different scattering 2 theta values).

3. Data analysis: Analyze the diffractogram for the sample. The analysis may include peak position, peak height, or peak shape analysis, as appropriate for the specific sample.
4. Sample characterization: Compare the X-ray diffractogram of the sample to a database of known materials. Characterize the sample components based on the peak positions in the diffractogram. The analysis may need a combination of techniques (e.g., FT-IR, EDS, GC-MS, … Read full answer

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