Sample interview questions: What methodologies and techniques do you employ in your research work as a materials scientist?
Sample answer:
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X-ray Diffraction (XRD): XRD is a technique used to determine the crystal structure of materials. It involves directing a beam of X-rays at a material and measuring the angles and intensities of the diffracted beams.
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Scanning Electron Microscopy (SEM): SEM is a technique used to image the surface of materials. It involves scanning a beam of electrons across the surface of a material and measuring the secondary electrons that are emitted.
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Transmission Electron Microscopy (TEM): TEM is a technique used to image the interior of materials. It involves passing a beam of electrons through a thin section of a material and measuring the transmitted electrons.
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Atomic Force Microscopy (AFM): AFM is a technique used to image the surface of materials at the atomic level. It involves scanning a sharp tip across the surface of a material and measuring the forces between the tip and the surface.
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Raman Spectroscopy: Raman Spectroscopy is a technique used to study the vibrational modes of molecules. It involves directing a beam of laser light at a material and measuring the inelastically scattered light.
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